X-ray Radiation Effects on Matching Properties of MOSFETs Implemented with Octagonal Layout Style: A Cluster-Based Statistical Approach
| Title: | X-ray Radiation Effects on Matching Properties of MOSFETs Implemented with Octagonal Layout Style: A Cluster-Based Statistical Approach |
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| Authors: | Peruzzi, Vinicius Vono; da Silva, Gabriel Augusto; Seixas, Luis Eduardo; de Melo, Wellington Romeiro; Finco, Saulo; Gimenez, Salvador Pinillos |
| Source: | 2025 39th Symposium on Microelectronics Technology and Devices (SBMicro) Microelectronics Technology and Devices (SBMicro), 2025 39th Symposium on. 1:1-4 Aug, 2025 |
| Relation: | 2025 39th Symposium on Microelectronics Technology and Devices (SBMicro) |
| Database: | IEEE Xplore Digital Library |