| Title: |
Inter-Laboratory Comparison of Gate Resistance Thermometry Measurements of RF GaN HEMTs |
| Authors: |
Matlock, Dashiel; Jurcik, Emils; Shoemaker, Daniel C.; Kim, Seokjun; Frey, Dave; Gebara, Edward; Tahhan, Maher; DeJarld, Matt; Chumbes, Eduardo M.; Laroche, Jeffrey; Graham, Samuel; Choi, Sukwon; Miller, Nicholas C. |
| Source: |
2025 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2025 IEEE. :1-4 Oct, 2025 |
| Relation: |
2025 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) |
| Database: |
IEEE Xplore Digital Library |