| Title: |
Sb/Te Ratio Engineering in Phase-Change Memory for High SET Speed and Large Memory Window |
| Authors: |
Antonelli, R.; Daoudi, O.; Bourgeois, G.; Salvi, A.; Gout, S.; Bernard, M.; Fellouh, L.; Rottner, J.; Castellani, N.; Bernier, N.; Saghi, Z.; Jannaud, A.; Fillot, F.; Nolot, E.; Andrieu, F.; Souifi, A.; Navarro, G. |
| Source: |
2025 IEEE European Solid-State Electronics Research Conference (ESSERC) Solid-State Electronics Research Conference (ESSERC), 2025 IEEE European. :237-240 Sep, 2025 |
| Relation: |
2025 IEEE European Solid-State Electronics Research Conference (ESSERC) |
| Database: |
IEEE Xplore Digital Library |