Exploring “Many in Few” and “Few in Many” Properties in Long-Tailed, Highly Imbalanced IC Defect Classification
| Title: | Exploring “Many in Few” and “Few in Many” Properties in Long-Tailed, Highly Imbalanced IC Defect Classification |
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| Authors: | Shao, H.; Chang, C.; Lin, Y.; Lin, C.; Fang, S.; Liu, Y. |
| Source: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 45(6):2813-2825 Jun, 2026 |
| Database: | IEEE Xplore Digital Library |