Charge Distribution at Metal/Dielectric Interfaces Using Sub-Micrometer-Scale Measurements
| Title: | Charge Distribution at Metal/Dielectric Interfaces Using Sub-Micrometer-Scale Measurements |
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| Authors: | Hugo, Antonella; Villeneuve-Faure, Christina; Le Roy, Severine |
| Source: | 2025 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2025 IEEE Conference on. :917-920 Sep, 2025 |
| Relation: | 2025 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) |
| Database: | IEEE Xplore Digital Library |