Simulation-Based Analysis of TEV Sensor Sensitivity for Partial Discharge Detection
| Title: | Simulation-Based Analysis of TEV Sensor Sensitivity for Partial Discharge Detection |
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| Authors: | Abbasi, Mahdi; Lachance, Mathieu; David, Eric |
| Source: | 2025 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2025 IEEE Conference on. :113-116 Sep, 2025 |
| Relation: | 2025 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) |
| Database: | IEEE Xplore Digital Library |