Heavy Ion-Induced Degradation in Gallium Nitride High Electron Mobility Transistors
| Title: | Heavy Ion-Induced Degradation in Gallium Nitride High Electron Mobility Transistors |
|---|---|
| Authors: | Gray, J.A.; Sternberg, A.L.; Kauppila, J.S.; Ball, D.R.; Witulski, A.F.; Pilvelait, B.R.; Cameron, C.B.; Trippe, J.M.; Kosier, S.L.; Alles, M.L.; Davidson, J.L.; Schrimpf, R.D.; Massengill, L.W. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 73(4):1214-1224 Apr, 2026 |
| Database: | IEEE Xplore Digital Library |