ESD HBM Failures of Different Cap Layer and Barrier Thinning Effects in GaN-on-Si AlGaN/GaN HEMTs
| Title: | ESD HBM Failures of Different Cap Layer and Barrier Thinning Effects in GaN-on-Si AlGaN/GaN HEMTs |
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| Authors: | Wu, Wei-Min; Su, C.-Y.; Yu, H.; Chen, H.-C.; Sibaja-Hernandez, A.; Parvais, B.; Peralagu, U.; Wu, T.-L.; Collaert, N. |
| Source: | 2025 47th Annual EOS/ESD Symposium (EOS/ESD) EOS/ESD Symposium (EOS/ESD), 2025 47th Annual. 47:1-7 Sep, 2025 |
| Relation: | 2025 47th Annual EOS/ESD Symposium (EOS/ESD) |
| Database: | IEEE Xplore Digital Library |