Improved Interface Reliability and Critical Current Retention in Multifilamentary REBCO Tapes via a Plasma-Deposited Film
| Title: | Improved Interface Reliability and Critical Current Retention in Multifilamentary REBCO Tapes via a Plasma-Deposited Film |
|---|---|
| Authors: | Li, M.; Chen, J.; Chen, H.; Zhu, X.; Wang, M. |
| Source: | IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 36(3):1-5 May, 2026 |
| Database: | IEEE Xplore Digital Library |