Inline Characterization of Polysilicon Layers in TOPCon Solar Cell Precursors With Reflectance Spectroscopy
| Title: | Inline Characterization of Polysilicon Layers in TOPCon Solar Cell Precursors With Reflectance Spectroscopy |
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| Authors: | Kumar, S.; Narayan, H.; Diestel, C.; Schmitz, J.; Haunschild, J.; Rein, S.; Rupitsch, S.J. |
| Source: | IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 16(1):113-119 Jan, 2026 |
| Database: | IEEE Xplore Digital Library |