Unraveling the Drain-Voltage Dependency of Trapping Effect Dynamics in GaN-HEMTs
| Title: | Unraveling the Drain-Voltage Dependency of Trapping Effect Dynamics in GaN-HEMTs |
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| Authors: | Weiser, Mathias C. J.; Miller, David; Vogel, Ulrich; Schnitzler, Ruben; Fink, Tobias; Kallfass, Ingmar |
| Source: | 2025 Energy Conversion Congress & Expo Europe (ECCE Europe) Energy Conversion Congress & Expo Europe (ECCE Europe), 2025. :1-6 Sep, 2025 |
| Relation: | 2025 Energy Conversion Congress & Expo Europe (ECCE Europe) |
| Database: | IEEE Xplore Digital Library |