| Title: |
Integration of Non-Invasive Electro-Optical Application in SRAM Analysis |
| Authors: |
Khang, Chee Weng; Sheng, Foo Loke; Hooi, Liew Chik; Liu, Jonathan |
| Source: |
2025 IEEE 32nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) the Physical and Failure Analysis of Integrated Circuits (IPFA), 2025 IEEE 32nd International Symposium on. :1-5 Aug, 2025 |
| Relation: |
2025 IEEE 32nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| Database: |
IEEE Xplore Digital Library |