| Title: |
Quality Assurance Testing for Detecting Magnetization Defects in Surface PM Synchronous Machines |
| Authors: |
Lee, Hojun; Yoon, YeEun; Zapico, Marcos Orviz; Shin, Seungmin; Tiemblo, Javier G.; Laborda, Diego F.; Reigosa, David Diaz; Lee, Sang Bin |
| Source: |
2025 IEEE Energy Conversion Conference Congress and Exposition (ECCE) Energy Conversion Conference Congress and Exposition (ECCE), 2025 IEEE. :1-7 Oct, 2025 |
| Relation: |
2025 IEEE Energy Conversion Conference Congress and Exposition (ECCE) |
| Database: |
IEEE Xplore Digital Library |