| Title: |
LLM-Based Hybrid Framework for Industrial Anomaly Detection for Smart Manufacturing |
| Authors: |
Tee, Fu Swee; Bee Theng, Lau; Kit Tsun, Mark Tee; Foo Yijia, Deron |
| Source: |
2025 IEEE International Conference on Artificial Intelligence in Engineering and Technology (IICAIET) Artificial Intelligence in Engineering and Technology (IICAIET), 2025 IEEE International Conference on. :1-6 Aug, 2025 |
| Relation: |
2025 IEEE International Conference on Artificial Intelligence in Engineering and Technology (IICAIET) |
| Database: |
IEEE Xplore Digital Library |