Changes in IEEE C37.20.7 that Impact Internal ARC Testing and Medium Voltage MCCS
| Title: | Changes in IEEE C37.20.7 that Impact Internal ARC Testing and Medium Voltage MCCS |
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| Authors: | Simms, Stan R.; Bhalla, Richard; Farr, Thomas A.; Harrison, Kyle |
| Source: | 2024 IEEE IAS Petroleum and Chemical Industry Technical Conference (PCIC) Petroleum and Chemical Industry Technical Conference (PCIC), 2024 IEEE IAS. :383-390 Sep, 2024 |
| Relation: | 2024 IEEE IAS Petroleum and Chemical Industry Technical Conference (PCIC) |
| Database: | IEEE Xplore Digital Library |