| Title: |
Assessing Radiation-Induced Degradation System-Level Effects from Device-Level Effects |
| Authors: |
Nederlander, Richard H.; Witulski, Arthur F.; Karsai, Gabor; Ladbury, Ray L.; Zhang, En Xia; Mahadevan, Nag |
| Source: |
2024 24th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2024 24th European Conference on. :1-4 Sep, 2024 |
| Relation: |
2024 24th European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
| Database: |
IEEE Xplore Digital Library |