| Title: |
Mitigating Overfitting in Fine-Pattern Quality Classification: Enabling Automated Projection Image Quality Inspection |
| Authors: |
Hu, Chih-Yao; Chou, Po-Yung; Lin, Cheng-Hung; Kuo, Kuan-Yen; Chen, You-Min; Wang, Wen-Chun |
| Source: |
2025 IEEE International Conference on Recent Advances in Systems Science and Engineering (RASSE) Recent Advances in Systems Science and Engineering (RASSE), 2025 IEEE International Conference on. :1-6 Nov, 2025 |
| Relation: |
2025 IEEE International Conference on Recent Advances in Systems Science and Engineering (RASSE) |
| Database: |
IEEE Xplore Digital Library |