| Title: |
Reliability test program for submillimeter-wave low-noise amplifiers |
| Authors: |
Kantanen, Mikko; Varis, Jussi; Karkkainen, Mikko; Leuther, Arnulf; Tessmann, Axel; Rosch, Markus; Latti, Jouni |
| Source: |
2025 50th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2025 50th International Conference on. :1-2 Aug, 2025 |
| Relation: |
2025 50th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) |
| Database: |
IEEE Xplore Digital Library |