| Title: |
Toward In-House 3D Nanoscale X-Ray Tomography of Integrated Circuits for Quality Control and Hardware Security at Speed of Need |
| Authors: |
Fonseca, Jordan; Nakamura, Nathan; Szypryt, Paul; Fowler, Joseph W.; Levine, Zachary H.; Vladar, Andras E.; Scott, John Henry; Kim, Felix H.; Swetz, Daniel S. |
| Source: |
2025 IEEE Physical Assurance and Inspection of Electronics (PAINE) Physical Assurance and Inspection of Electronics (PAINE), 2025 IEEE. :1-7 Oct, 2025 |
| Relation: |
2025 IEEE Physical Assurance and Inspection of Electronics (PAINE) |
| Database: |
IEEE Xplore Digital Library |