Impact of Hot Carriers on Track Structure Formation When Modeling Single-Event Effects in FinFETs
| Title: | Impact of Hot Carriers on Track Structure Formation When Modeling Single-Event Effects in FinFETs |
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| Authors: | Vielmette, J.T.; Ball, D.R.; Trippe, J.M.; Walker, D.G.; Fischetti, M.V.; Nielsen, D.O.; Schrimpf, R.D. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 73(4):1137-1144 Apr, 2026 |
| Database: | IEEE Xplore Digital Library |