Output Capacitance Extraction of p-GaN HEMTs Under Multi Pulse Switching Across Variable Frequencies and Drain-Bias Stress
| Title: | Output Capacitance Extraction of p-GaN HEMTs Under Multi Pulse Switching Across Variable Frequencies and Drain-Bias Stress |
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| Authors: | Liu, X.; Chen, J.; Wang, S.; Wu, S.; Jiang, Z.; Radzi, M.A.M.; Azis, N.; Shafie, S.; Hua, M. |
| Source: | IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 41(6):8927-8937 Jun, 2026 |
| Database: | IEEE Xplore Digital Library |