DSK-YOLO: Feature-level Super Resolution Boosted Industrial Defect Detection
| Title: | DSK-YOLO: Feature-level Super Resolution Boosted Industrial Defect Detection |
|---|---|
| Authors: | Mu, Meichen; Liu, Meiqin; Zhang, Senlin; Du, Shaoyi |
| Source: | 2025 IEEE International Conference on Systems, Man, and Cybernetics (SMC) Systems, Man, and Cybernetics (SMC), 2025 IEEE International Conference on. :722-727 Oct, 2025 |
| Relation: | 2025 IEEE International Conference on Systems, Man, and Cybernetics (SMC) |
| Database: | IEEE Xplore Digital Library |