Analysis of the Temperature-Dependent Mechanism of MIS-HEMT in Negative Bias Stress Under X-Ray Irradiation
| Title: | Analysis of the Temperature-Dependent Mechanism of MIS-HEMT in Negative Bias Stress Under X-Ray Irradiation |
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| Authors: | Lin, C.; Yeh, C.; Chen, P.; Chang, T.; Lee, Y.; Kuo, T.; Hsu, J.; Lin, J.; Chen, Y.; Tsai, Y. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(3):1210-1217 Mar, 2026 |
| Database: | IEEE Xplore Digital Library |