| Title: |
Gate-All-Around Technology for Sustainable AI: A Foundation for Future Logic Architectures |
| Authors: |
Kwon, Wookhyun; Lee, Jaehong; Hong, Byounghak; Kang, Myunggil; Jeong, Jinsu; Lee, Seunghwan; Fukutome, Hidenobu; Kim, Byung-Sung; Rim, Ken; Song, Jaihyuk |
| Source: |
2025 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2025 IEEE International. :1-4 Dec, 2025 |
| Relation: |
2025 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |