| Title: |
High-Density RRAM for Advanced Logic Process: A Hybrid-Driven Cell with Self-Aligned Isolation Scalable to FinFET Technology |
| Authors: |
Sun, Jingwei; Wang, Zongwei; Cai, Zhixing; Bao, Shengyu; Wu, Zimeng; Chu, Yanbang; Wu, Heng; Ji, Yingchen; Xie, Ruiqing; Bao, Lin; Zhou, Zheng; Liang, Ling; Yu, Zhizhen; Feng, Gaoming; Guo, Ao; Lu, Yifei; Li, Chen; Chen, Shoumian; Zhao, Yuhang; Cai, Yimao; Huang, Ru |
| Source: |
2025 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2025 IEEE International. :1-4 Dec, 2025 |
| Relation: |
2025 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |