| Title: |
Highly Scaled FRAM Technology in 22FDX® Achieving Sub 1 V Operation |
| Authors: |
Muller, F.; Iurchuk, V.; Viegas, A.; Yadav, N.; Syndikus, J.; Seidel, R.; Lehninger, D.; Hoffmann, R.; Olivo, R.; Mutter, J.; Mulaosmanovic, H.; Seidel, K.; Kampfe, T.; Muller, J.; Soss, S.; Beyer, S.; Lederer, M. |
| Source: |
2025 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2025 IEEE International. :1-4 Dec, 2025 |
| Relation: |
2025 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |