| Title: |
3D-Stackable Double-Gate Nanosheet (DGNS) FeFETs with Separate Read/Write Paths: Suppressed Variability with Sub-2 % Bit Error Rate and Mitigated Subthreshold Swing Degradation |
| Authors: |
Wu, F.; Chiu, C.-Y.; Wu, C.-H.; Tsai, Y.-L.; Chen, S.-H.; Lin, H.-C.; Hu, V. P.-H.; Su, C.-J.; Su, P. |
| Source: |
2025 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2025 IEEE International. :1-4 Dec, 2025 |
| Relation: |
2025 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |