| Title: |
First Experimental Insights into Access-Rate-Dependent Ferroelectric Memory Degradation: Mechanisms and Mitigation through Hybrid Polar Recovery and Operation-Device Co-Optimization |
| Authors: |
Wu, C.-H.; Pun, T.; Wu, J.-T.; Sung, C.-W.; Tseng, Y.-M.; Lin, P.-L.; Chen, W.-T.; Chu, P.-W.; Wu, C.-T.; Su, C.-J.; Hu, V. P.-H. |
| Source: |
2025 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2025 IEEE International. :1-4 Dec, 2025 |
| Relation: |
2025 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |