| Title: |
Towards a Low-Disorder pFET Gate Stack for Monolayer WSe2 Channels |
| Authors: |
Ngo, T. D.; Arutchelvan, G.; Chou, S. A.; Lin, Z.; Grubbs, R. K.; Ghosh, S.; Cott, D.; Banerjee, K.; Wu, X.; Li, M.-Y.; Van Dal, M.; Radu, I. P.; de la Rosa, C. J. L.; Kar, G. Sankar; Govoreanu, B. |
| Source: |
2025 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2025 IEEE International. :1-4 Dec, 2025 |
| Relation: |
2025 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |