DTCO of Multi-Tier CFETs: Ultimate Logic and SRAM Scaling of A5 Technology and Beyond
| Title: | DTCO of Multi-Tier CFETs: Ultimate Logic and SRAM Scaling of A5 Technology and Beyond |
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| Authors: | Shon, Minji; Lim, Seongkwang; Yu, Shimeng |
| Source: | 2025 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2025 IEEE International. :1-4 Dec, 2025 |
| Relation: | 2025 IEEE International Electron Devices Meeting (IEDM) |
| Database: | IEEE Xplore Digital Library |