Screening for Manufacturing Defects that Manifest as Silent Data Errors in Data Center Processors
| Title: | Screening for Manufacturing Defects that Manifest as Silent Data Errors in Data Center Processors |
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| Authors: | Lerner, D.; Hansen, E.; Sakthivelu, S.; Carrizo, C.; Tzu-Lin, S.; Macieira, T.; Kelly, B. |
| Source: | 2025 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2025 IEEE International. :1-4 Dec, 2025 |
| Relation: | 2025 IEEE International Electron Devices Meeting (IEDM) |
| Database: | IEEE Xplore Digital Library |