| Title: |
Direct Atomic Layer Processing TiO2 RRAM Gas Sensor for Real-time All-RRAM Intelligent Gas Perception |
| Authors: |
Chiang, Tung-Lin; Hong, Ming-Chun; Huang, Shang-Rong; Chiou, Bo-Cheng; Lin, Chih-Sheng; Cheng, Yu-Hao; Dehghan, Mohammad; Scepka, Tomas; Horsky, Matej; Svec, Peter; Patrnciak, Michal; Plecenik, Tomas; Carnoy, Matthias; Parfeniukas, Karolis; Plakhotnyuk, Maksym; Borie, Benjamin; Hudec, Boris; Hou, Tuo-Hung |
| Source: |
2025 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2025 IEEE International. :1-4 Dec, 2025 |
| Relation: |
2025 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |