| Title: |
Modeling of Lifetime Assessment Method for Germanium-Silicon Photodetectors under High-Temperature Stress |
| Authors: |
Cheng, Faci; Liu, Tingting; Xiao, Shuyuan; Liu, Yuebo; Lu, Jianting; Niu, Hao |
| Source: |
2025 7th International Conference on System Reliability and Safety Engineering (SRSE) System Reliability and Safety Engineering (SRSE), 2025 7th International Conference on. :80-84 Nov, 2025 |
| Relation: |
2025 7th International Conference on System Reliability and Safety Engineering (SRSE) |
| Database: |
IEEE Xplore Digital Library |