| Title: |
Scalable, High-Fidelity Monitoring of Application Communication Patterns in Vernier |
| Authors: |
Dominguez-Trujillo, Jered; Schafer, Derek; Shipley, Riley; Marshall, Ryan; Bacon, Nicholas; Moraru, Maxim; Shipman, Galen; Skjellum, Anthony; Bridges, Patrick |
| Source: |
SC25-W: Workshops of the International Conference for High Performance Computing, Networking, Storage and Analysis High Performance Computing, Networking, Storage and Analysis, SC25-W: Workshops of the International Conference for. :1611-1623 Nov, 2025 |
| Relation: |
SC25-W: Workshops of the International Conference for High Performance Computing, Networking, Storage and Analysis |
| Database: |
IEEE Xplore Digital Library |