Layout and Testing Considerations for Developing Discrete Silicon-Carbide Three-Level T-Type Phase-Leg
| Title: | Layout and Testing Considerations for Developing Discrete Silicon-Carbide Three-Level T-Type Phase-Leg |
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| Authors: | Xu, J.; Zhang, L.; Yang, J.; Yue, Y.; Yin, T.; Yang, H.; Lin, L. |
| Source: | IEEE Journal of Emerging and Selected Topics in Power Electronics IEEE J. Emerg. Sel. Topics Power Electron. Emerging and Selected Topics in Power Electronics, IEEE Journal of. 14(3):3130-3142 Jun, 2026 |
| Database: | IEEE Xplore Digital Library |