| Title: |
Design Exploration of 10T SRAM Architectures for Stability in Error-Sensitive Applications at 22 nm CMOS Technology |
| Authors: |
Rahman, Md Atiqur; Islam, Md. Tonmoi; Ahmed, Shihab; Rashed, Md. Rashedul Islam; Shahabuddin, Akm; Maruf, Md. Hasan |
| Source: |
2025 IEEE 7th International Conference on Sustainable Technologies For Industry 5.0 (STI) Sustainable Technologies For Industry 5.0 (STI), 2025 IEEE 7th International Conference on. :1-6 Dec, 2025 |
| Relation: |
2025 IEEE 7th International Conference on Sustainable Technologies For Industry 5.0 (STI) |
| Database: |
IEEE Xplore Digital Library |