ThermoVision: Nondestructive Defect Mapping in 3-D Stacked Dies via Surface Thermography and Deep Learning
| Title: | ThermoVision: Nondestructive Defect Mapping in 3-D Stacked Dies via Surface Thermography and Deep Learning |
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| Authors: | Zhao, C.; Sim, J.; Chang, S.; Im, Y.; Won, Y. |
| Source: | IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manuf. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 16(4):757-764 Apr, 2026 |
| Database: | IEEE Xplore Digital Library |