High-κ Capping Layer Effects on Carrier Polarity and Reliability of SWNT Field Effect Transistors With Spin-on-Glass Buffer Layer
| Title: | High-κ Capping Layer Effects on Carrier Polarity and Reliability of SWNT Field Effect Transistors With Spin-on-Glass Buffer Layer |
|---|---|
| Authors: | Lee, Y.S.; Park, S.; Bin Jo, H.; Min Kim, H.; Bae, H.; Hun Jin, S. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(3):1647-1655 Mar, 2026 |
| Database: | IEEE Xplore Digital Library |