Anomalyspy: A Generative Defect Localization in Semiconductor Packages, with X-Ray Microscopy
| Title: | Anomalyspy: A Generative Defect Localization in Semiconductor Packages, with X-Ray Microscopy |
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| Authors: | Made, Riko I; Kumar, Pawan; Velasco, Pablo Quijano; Koon, Ng Chee; Jie, Leong Chang |
| Source: | 2025 IEEE 27th Electronics Packaging Technology Conference (EPTC) Electronics Packaging Technology Conference (EPTC), 2025 IEEE 27th. :1-5 Dec, 2025 |
| Relation: | 2025 IEEE 27th Electronics Packaging Technology Conference (EPTC) |
| Database: | IEEE Xplore Digital Library |