Analysis of Reverse Breakdown Mechanisms and Bias-Dependent Conduction Path Evolution in p-GaN HEMTs
| Title: | Analysis of Reverse Breakdown Mechanisms and Bias-Dependent Conduction Path Evolution in p-GaN HEMTs |
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| Authors: | Lin, C.; Lee, Y.; Chen, P.; Chang, T.; Hsu, J.; Chen, Y.; Lin, J.; Yao, Y. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(3):1285-1291 Mar, 2026 |
| Database: | IEEE Xplore Digital Library |