On the Reliability of Complementary Field Effect Transistor: Unveiling the Role of Grain Granularities and Random Fluctuations
| Title: | On the Reliability of Complementary Field Effect Transistor: Unveiling the Role of Grain Granularities and Random Fluctuations |
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| Authors: | Kumar, S.; Patil, D.H.; Rathore, S.; Dixit, A.; Kumar, N.; Georgiev, V.; Dasgupta, S.; Bagga, N. |
| Source: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 26(1):365-371 Mar, 2026 |
| Database: | IEEE Xplore Digital Library |