| Title: |
Automated Detection of Rotten and Fresh Fruits and Vegetables with Shelf Life Prediction Using YOLO |
| Authors: |
Kumar, Adarsh; Banashankari, Vineet; Arun, V. |
| Source: |
2025 IEEE 9th International Conference on Information and Communication Technology (CICT) Information and Communication Technology (CICT), 2025 IEEE 9th International Conference on. :1-6 Dec, 2025 |
| Relation: |
2025 IEEE 9th International Conference on Information and Communication Technology (CICT) |
| Database: |
IEEE Xplore Digital Library |