| Title: |
A Novel Approach for Fault Detection and Failure Analysis of CMOS Copper Metal Stacks |
| Authors: |
Eberwein, G.H.; Aglieri Rinella, G.; Bortoletto, D.; Bugiel, S.; Carnesecchi, F.; Di Mauro, A.; Leitao, P.V.; Hillemanns, H.; Imhoff, M.A.; Junique, A.; Kluge, A.; Mager, M.; Martinengo, P.; Panasenko, I.; Ravasenga, I.; Reidt, F.; Sarritzu, V.; Snoeys, W.; Suljic, M. |
| Source: |
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 73(4):1501-1506 Apr, 2026 |
| Database: |
IEEE Xplore Digital Library |