Bias-Dependent Trap Characterization in Hydrogen-Terminated Diamond MOSFETs Using Transient Current Analysis
| Title: | Bias-Dependent Trap Characterization in Hydrogen-Terminated Diamond MOSFETs Using Transient Current Analysis |
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| Authors: | Pan, S.; Zhou, C.; Feng, S.; Lu, X.; He, Z.; Li, H.; Yu, H.; Ma, M.; Zhang, X.; Yu, C.; Feng, Z. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(4):2461-2467 Apr, 2026 |
| Database: | IEEE Xplore Digital Library |