A Data-Driven Approach to Predict the Impact of Void Characteristics on IGBT Junction Temperature
| Title: | A Data-Driven Approach to Predict the Impact of Void Characteristics on IGBT Junction Temperature |
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| Authors: | Wei, Y.; Yang, X.; Wu, P.; Liu, G. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(4):2106-2115 Apr, 2026 |
| Database: | IEEE Xplore Digital Library |