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Multi-Sampling-Frequency Naturalness MOS Prediction Using Self-Supervised Learning Model with Sampling-Frequency-Independent Layer

Title:	Multi-Sampling-Frequency Naturalness MOS Prediction Using Self-Supervised Learning Model with Sampling-Frequency-Independent Layer
Authors:	Nishikawa, Go; Nakata, Wataru; Saito, Yuki; Imamura, Kanami; Saruwatari, Hiroshi; Nakamura, Tomohiko
Source:	2025 IEEE Automatic Speech Recognition and Understanding Workshop (ASRU) Automatic Speech Recognition and Understanding Workshop (ASRU), 2025 IEEE. :1-4 Dec, 2025
Relation:	2025 IEEE Automatic Speech Recognition and Understanding Workshop (ASRU)
Database:	IEEE Xplore Digital Library