Wafer-Scale Low-Temperature Measurements of Transition-Edge Sensors during Fabrication
| Title: | Wafer-Scale Low-Temperature Measurements of Transition-Edge Sensors during Fabrication |
|---|---|
| Authors: | Weber, J.C.; Nobles, J.E.; Singh, R.; Roy, A.; Morgan, K.M.; Ortiz, N.J.; Van Lanen, J.; Bae, K.; Duff, S.M.; Swetz, D.S.; O'Neil, G.C.; Ullom, J.N.; Schmidt, D.R. |
| Source: | IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 36(6):1-5 Sep, 2026 |
| Database: | IEEE Xplore Digital Library |