Simultaneous Observation of Donor- and Acceptor-Like Interface Trap Density in 5-Stage Si-NW GAA FETs Using Polychromatic Photonic I–V Characteristics
| Title: | Simultaneous Observation of Donor- and Acceptor-Like Interface Trap Density in 5-Stage Si-NW GAA FETs Using Polychromatic Photonic I–V Characteristics |
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| Authors: | Lim, S.; Yoo, J.; Lee, H.; Park, M.; Park, S.; Jung, S.; Lee, D.; Lee, S.; Shin, D.; Park, J.; Choi, Y.; Bae, H. |
| Source: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 47(5):861-864 May, 2026 |
| Database: | IEEE Xplore Digital Library |