| Title: |
RF Design-Oriented ACM Model Generation Using Parametric Test and Machine Learning Regression in 28nm FD-SOI CMOS Technology |
| Authors: |
Dobrin, C. A.; Neto, D. G. Alves; Gaidioz, D.; Cathelin, P.; Bourdel, S.; Barragan, M. J. |
| Source: |
2026 IEEE 17th Latin America Symposium on Circuits and System (LASCAS) Circuits and System (LASCAS), 2026 IEEE 17th Latin America Symposium on. :1-5 Feb, 2026 |
| Relation: |
2026 IEEE 17th Latin America Symposium on Circuits and System (LASCAS) |
| Database: |
IEEE Xplore Digital Library |