| Title: |
Simple Line Lengths for Multiline Thru-Reflect-Line Calibration |
| Authors: |
Adhikary, M.; Lee, J.; Bergmann, F.; Bosworth, B.T.; Osella, A.; Cheron, J.; Karpisz, T.; Jungwirth, N.R.; Jones, R.D.; Lewandowski, A.; Jamroz, B.F.; Jargon, J.A.; Booth, J.C.; Stelson, A.; Long, C.J.; Orloff, N.D. |
| Source: |
IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 74(6):5310-5321 Jun, 2026 |
| Database: |
IEEE Xplore Digital Library |